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metodar > microscopy (en) > scanning microscopy (en) > scanning electron microscopy (en)

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scanning electron microscopy (en)  

定义

  • Information Çok küçük bir alana odaklanan yüksek enerjili elektronlar kullanarak örnek yüzeyini tarama sonucu yüksek çözünürlüklü ve üç boyutlu görüntü alınmasını sağlayan bir elektron mikroskobu türü.

    来源: http://terim.tuba.gov.tr/

    创建的: 5/9/23

     (tr)
  • Information Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions.

    创建的: 4/27/23

     (en)

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RDF/XML TURTLE JSON-LD 创建的 2023/4/27, 最后修改 2024/9/30