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ວິທີການ > ການສ່ອງດ້ວຍກ້ອງຈຸລະທັດ > scanning microscopy (en) > scanning electron microscopy (en)

Terme préférentiel

scanning electron microscopy (en)  

Définition

  • Information Çok küçük bir alana odaklanan yüksek enerjili elektronlar kullanarak örnek yüzeyini tarama sonucu yüksek çözünürlüklü ve üç boyutlu görüntü alınmasını sağlayan bir elektron mikroskobu türü.

    Source: http://terim.tuba.gov.tr/

    Date de création: 5/9/23

     (tr)
  • Information Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions.

    Date de création: 4/27/23

     (en)

Concept générique

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URI

http://aims.fao.org/aos/agrovoc/c_a87b3af2

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RDF/XML TURTLE JSON-LD Date de création 27/04/2023, dernière modification le 30/09/2024