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methods > microscopy > scanning microscopy > scanning electron microscopy

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void:inDataset: http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc

Creado: 2023-04-27T10:07:47

skos:notation: a87b3af2

scanning electron microscopy  

Definición

  • Information Çok küçük bir alana odaklanan yüksek enerjili elektronlar kullanarak örnek yüzeyini tarama sonucu yüksek çözünürlüklü ve üç boyutlu görüntü alınmasını sağlayan bir elektron mikroskobu türü. (tr)
  • Information Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions.

    Creado: 4/27/23

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URI

http://aims.fao.org/aos/agrovoc/c_a87b3af2

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RDF/XML TURTLE JSON-LD Creado 27/4/23, última modificación 30/9/24