Skip to main content

Concept information

There is no term for this concept in this language.

Methode > Mikroskopie > Rastermikroskopie > scanning electron microscopy (en)

Preferred term

scanning electron microscopy (en)  

Definition

  • Information Çok küçük bir alana odaklanan yüksek enerjili elektronlar kullanarak örnek yüzeyini tarama sonucu yüksek çözünürlüklü ve üç boyutlu görüntü alınmasını sağlayan bir elektron mikroskobu türü. (tr)
  • Information Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions.

    Created: 4/27/23

    (en)

Broader concept

In other languages

URI

http://aims.fao.org/aos/agrovoc/c_a87b3af2

Download this concept:

RDF/XML TURTLE JSON-LD Created 4/27/23, last modified 9/30/24